Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

Chen, Xian; Dejoie, Catherine; Jiang, Tengfei; Ku, Ching-Shun; Tamura, Nobumichi

doi:10.1557/mrs.2016.97

Title: Quantitative microstructural imaging by scanning Laue x-ray micro- and nanodiffraction

Journal Article · Wed Jun 01 00:00:00 EDT 2016 · MRS Bulletin

DOI:https://doi.org/10.1557/mrs.2016.97· OSTI ID:1375006

Chen, Xian; Dejoie, Catherine; Jiang, Tengfei; Ku, Ching-Shun; Tamura, Nobumichi

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: Advanced Light Source Division

OSTI ID:: 1375006

Report Number(s):: LBNL-1005739; applab; ir:1005739

Journal Information:: MRS Bulletin, Vol. 41, Issue 06; ISSN 0883-7694

Publisher:: Materials Research Society

Country of Publication:: United States

Language:: English

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Data-driven approach for synchrotron X-ray Laue microdiffraction scan analysis Song, Yintao; Tamura, Nobumichi; Zhang, Chenbo Acta Crystallographica Section A Foundations and Advances, Vol. 75, Issue 6 https://doi.org/10.1107/s2053273319012804	journal	October 2019
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