Simulation of the signals of a pancake-type transducer caused by a plane defect of arbitrary form
Redistribution of eddy currents caused by a defect is represented by a multitude of the fine circular contours located in that portion of the area of significant eddy currents associated with the defect. The current in the contours of the model {Delta}I{sub km} is expressed in terms of the primary current of each defect I{sub km} and the function of influence of the defect calculated with use of equivalent electrical circuits. The discretely distributed density of eddy currents is considered as an external current in the Helmholtz equation by solution of which an equation is obtained for the eddy current transducer voltage introduced by the defect. The method presented for calculation of eddy current transducer signals from a plane defect may be used in many cases for any type of pancake, solenoid, submersible, screen, and other transducers and for any form of object of inspection when the rule of spatial distribution of the eddy current density is known.
- OSTI ID:
- 135947
- Journal Information:
- Russian Journal of Nondestructive Testing, Vol. 30, Issue 2; Other Information: PBD: Oct 1994; TN: Translated from Defektoskopiya; No. 2, 19-26(Feb 1994)
- Country of Publication:
- United States
- Language:
- English
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