Transient x-ray diffraction with simultaneous imaging under high strain-rate loading

Journal Article · Sat Nov 01 00:00:00 EDT 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4900861· OSTI ID:1350082

Fan, D.; Lu, L.; Li, B.; Qi, M. L.; E, J. C.; Zhao, F.; Sun, T.; Fezzaa, K.; Chen, W.; Luo, S. N.

Real time, in situ, multiframe, diffraction, and imaging measurements on bulk samples under high and ultrahigh strain-rate loading are highly desirable for micro-and mesoscale sciences. We present an experimental demonstration of multiframe transient x-ray diffraction (TXD) along with simultaneous imaging under high strain-rate loading at the Advanced Photon Source beamline 32ID. The feasibility study utilizes high strain-rate Hopkinson bar loading on a Mg alloy. The exposure time in TXD is 2-3 mu s, and the frame interval is 26.7-62.5 mu s. Various dynamic deformation mechanisms are revealed by TXD, including lattice expansion or compression, crystal plasticity, grain or lattice rotation, and likely grain refinement, as well as considerable anisotropy in deformation. Dynamic strain fields are mapped via x-ray digital image correlation, and are consistent with the diffraction measurements and loading histories.

• Research Organization: Argonne National Lab. (ANL), Argonne, IL (United States)
• Sponsoring Organization: National Natural Science Foundation of China (NNSFC); USDOE Office of Science (SC), Basic Energy Sciences (BES)
• DOE Contract Number: AC02-06CH11357
• OSTI ID: 1350082
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 11; ISSN 0034-6748
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English