32 and 45 nm Radiation-Hardened-By-Design (RHBD) SOI Latches.

Journal Article · Mon Aug 01 00:00:00 EDT 2011 · IEEE Transactions on Nuclear Science, Dec. 2011

OSTI ID:1106589

Schwank, James R.; Rodbell, Kenneth P.; Heidel, David F.; Pellish, Jonathan A.; Marshall, Paul W.; Tang, Henry H.K.; Murray, Conal E.; LaBel, Kenneth A.; Gordon, Michael S.; Stawiasz, Kevin G.; Berg, Melanie D.; Kim, Hak S.; Friendlich, Mark R.; Phan, Anthony M.; Seidleck, Christina M.

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1106589
• Report Number(s): SAND2011-5792J; 464224
• Journal Information: IEEE Transactions on Nuclear Science, Dec. 2011, Related Information: Proposed for publication in IEEE Transactions on Nuclear Science, Dec. 2011.
• Country of Publication: United States
• Language: English