Soft X-Ray Imaging Design and Analysis Methods on DIII-D

Conference · Sat Jan 01 00:00:00 EST 2011

OSTI ID:1092381

Shafer, Morgan W ^[1]; Battaglia, D. J. ^[2]; Unterberg, Ezekial A ^[1]; Canik, John ^[1]; Evans, T. E. ^[3]; Harris, Jeffrey H ^[1]; Meitner, Steven J ^[1]

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1. ORNL
2. Oak Ridge National Laboratory (ORNL)
3. General Atomics, San Diego

A new tangential 2D Soft X-Ray Imaging System (SXRIS) is being designed to examine the edge magnetic island structure in the lower X-point region of DIII-D. A synthetic diagnostic calculation coupled to 3D emissivity estimates is used to generate phantom images. Phillips-Tikhonov regularization is used to invert the phantom images for comparison to the original emissivity model. Noise level, island size, and equilibrium accuracy are scanned to assess the feasibility of detecting edge island structures. Models of typical DIII-D discharges indicate integration times > 1 ms with accurate equilibrium reconstruction are needed for small island (< 3 cm) detection.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1092381
• Resource Relation: Conference: 20th International Toki Conference, Toki City, Gifu, Japan, Japan, 20101207, 20101210
• Country of Publication: United States
• Language: English