Fe3O4/MgO/Fe Heteroepitaxial Structures for Magnetic Tunnel Junctions

Journal Article · Tue Jan 01 00:00:00 EST 2008 · IEEE Transactions on Magnetics

DOI:https://doi.org/10.1109/TMAG.2008.2002484· OSTI ID:1050919

Orna, J. ^[1]; Morellon, Luis ^[1]; Algarabel, Pedro A. ^[1]; Pardo, J. A. ^[1]; Sangiao, S ^[2]; Magen, C ^[3]; Snoeck, E. ^[4]; De Teresa, J M ^[5]; Ibarra, M. Ricardo ^[1]

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1. University of Zaragoza, Spain
2. Instituto de Nanociencia de Aragón, Universidad de Zaragoza, Zaragoza, 50009 Spain
3. Oak Ridge National Laboratory (ORNL)
4. CEMES-CNRS, Toulouse, France
5. Instituto de Ciencia de Materiales de Aragón, Universidad de Zaragoza-CSIC, Zaragoza, 50009 Spain

In this work we report the growth and structural and magnetic characterization of heteroepitaxial Fe O/MgO/Fe junctions. All three layers have been deposited by pulsed laser deposition. Combining High Resolution Transmission Electron Microscopy and X-ray results, we have obtained for the heterostructure the epitaxy relation MgO(001) [100]//Fe O(001)[100]/MgO(001) [100]/Fe(001)[110]. All interfaces appear very sharp with relatively small root-mean square (rms) roughness, 0.2 nm. The magnetic coupling between Fe O and Fe electrodes is also very small, 0.03 mJ/

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: DE-AC05-00OR22725
• OSTI ID: 1050919
• Journal Information: IEEE Transactions on Magnetics, Vol. 44, Issue 11; ISSN 0018-9464
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE
DEPOSITION
ELECTRODES
EPITAXY
LASERS
RESOLUTION
ROUGHNESS
TRANSMISSION ELECTRON MICROSCOPY