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Title: Simulation and optimization of the NSLS-II SRX beamline combining ray-tracing and wavefront propagation

Journal Article · · Advances in Computational Methods for X-Ray Optics II
DOI:https://doi.org/10.1117/12.894954· OSTI ID:1041596

The Sub-micron Resolution X-ray spectroscopy (SRX) beamline will benefit from the ultralow emittance of the National Synchrotron Light Source II to address a wide variety of scientific applications studying heterogeneous systems at the sub-micrometer scale. This work focuses on the KB branch ({Delta}E: 4.65-28 keV). Its main optical components include a horizontally focusing mirror forming an adjustable secondary source, a horizontally deflecting monochromator and two sets of Kirkpatrick-Baez mirrors as focusing optics of two distinct inline stations for operations requiring either high flux or high resolution. In the first approach, the beamline layout was optimized with ray-tracing calculations involving Shadowvui computer codes. As a result, the location and characteristics of optics were specified for achieving either the most intense or the smallest monochromatic beam possible on the target (10{sup 13} ph/s or 10{sup 12} ph/s respectively in a 500 nm or 65 nm focal spot). At the nanoprobe station, the diffraction limited focusing of X-rays is governed by the beam coherence. Hence, a classical geometric approach is not anymore adapted. To get reliable estimates of the Nanoprobe performances, a wavefront propagation study was performed using Synchrotron Radiation Workshop (SRW) code. At 7.2 keV, calculations show an intense (10{sup 12} ph/s) 67 nm wide diffraction limited spot achieved with actual metrological data of mirrors.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE SC OFFICE OF SCIENCE (SC)
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1041596
Report Number(s):
BNL-96707-2011-JA; 36KC02000; TRN: US1202683
Journal Information:
Advances in Computational Methods for X-Ray Optics II, Vol. 8141; Conference: SPIE; San Diego, CA; 20110821 through 20110825
Country of Publication:
United States
Language:
English

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