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Title: Proton- and x-ray beams generated by ultra-fast CO(2) lasers for medical applications

Journal Article · · Proceedings of SPIE - The International Society for Optical Engineering
DOI:https://doi.org/10.1117/12.889113· OSTI ID:1034037

Recent progress in using picosecond CO{sub 2} lasers for Thomson scattering and ion-acceleration experiments underlines their potentials for enabling secondary radiation- and particle-sources. These experiments capitalize on certain advantages of long-wavelength CO{sub 2} lasers, such as higher number of photons per energy unit, and favorable scaling of the electrons ponderomotive energy and critical plasma density. The high-flux x-ray bursts produced by Thomson scattering of the CO{sub 2} laser off a counter-propagating electron beam enabled high-contrast, time-resolved imaging of biological objects in the picosecond time frame. In different experiments, the laser, focused on a hydrogen jet, generated monoenergetic proton beams via the radiation-pressure mechanism. The strong power-scaling of this regime promises realization of proton beams suitable for laser-driven proton cancer therapy after upgrading the CO{sub 2} laser to sub-PW peak power. This planned improvement includes optimizing the 10-{mu}m ultra-short pulse generation, assuring higher amplification in the CO{sub 2} gas under combined isotopic- and power-broadening effects, and shortening the postamplification pulse to a few laser cycles (150-200 fs) via chirping and compression. These developments will move us closer to practical applications of ultra-fast CO{sub 2} lasers in medicine and other areas.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States). Accelerator Test Facility
Sponsoring Organization:
DOE - OFFICE OF SCIENCE
DOE Contract Number:
DE-AC02-98CH10886
OSTI ID:
1034037
Report Number(s):
BNL-96225-2011-JA; PSISDG; TRN: US1200703
Journal Information:
Proceedings of SPIE - The International Society for Optical Engineering, Vol. 8079; Conference: SPIE Conference - Optics and Optoelectronics 2011; Prague, Czech Republic; 20110418 through 20110421; ISSN 0277-786X
Country of Publication:
United States
Language:
English