Structural Comparison of n-type and p-type LaAlO3/SrTiO3 Interfaces
Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO{sub 3} and SrTiO{sub 3}, that is, p-type (SrO/AlO{sub 2}) and n-type (TiO{sub 2}/LaO) interfaces. Our results demonstrate that the SrTiO{sub 3} in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, the atomic intermixing was observed to extend deeper into STO substrate at the n-type interface than at the p-type. These differences result in different degrees of band bending, which likely contributes to the striking difference in electrical conductivity between the two types of interfaces.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76SF00515
- OSTI ID:
- 1022455
- Report Number(s):
- SLAC-PUB-14503; TRN: US201118%%171
- Journal Information:
- Submitted to Physical Review Letters, Journal Name: Submitted to Physical Review Letters
- Country of Publication:
- United States
- Language:
- English
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