Irradiation-related amorphization and crystallization: In situ transmission electron microscope studies
Interfacing an ion accelerator to a transmission electron microscope (TEM) allows the analytical functions of TEM imaging and diffraction to be employed during ion-irradiation effects studies. At present there are twelve such installations in Japan, one in France and one in the US. This paper treats several aspects of in situ studies involving electron and ion beam induced and enhanced phase transformations and presents results of several in situ experiments to illustrate the dynamics of this approach in the materials science of irradiation effects. The paper describes the ion- and electron-induced amorphization of CuTi; the ion-irradiation-enhanced transformation of TiCr{sub 2}; and the ion- and electron-irradiation-enhanced crystallization of CoSi{sub 2}.
- Research Organization:
- Argonne National Lab., IL (United States). Materials Science Div.
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10142453
- Report Number(s):
- ANL/MSD/CP-82380; CONF-940275-1; ON: DE94009823; TRN: AHC29410%%1
- Resource Relation:
- Conference: Symposium on high-voltage and high-resolution electron microscopy,Stuttgart (Germany),21-24 Feb 1994; Other Information: PBD: [1994]
- Country of Publication:
- United States
- Language:
- English
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