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Title: Atomic-scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the STEM

Conference ·
OSTI ID:10122372
; ; ;  [1]; ;  [2]
  1. Oak Ridge National Lab., TN (United States)
  2. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering

The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. The high-resolution Z-contrast imaging technique in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition can be interpreted intuitively. This direct image allows the electron probe to be positioned over individual atomic columns for parallel detection electron energy loss spectroscopy (EELS) at a spatial resolution approaching 0.22nm. In this paper we have combined the structural information available in the Z-contrast images with the bonding information obtained from the fine structure within the EELS edges to determine the grain boundary structure in a SrTiO{sub 3} bicrystal.

Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
10122372
Report Number(s):
CONF-931108-69; ON: DE94006563
Resource Relation:
Conference: Fall meeting of the Materials Research Society (MRS),Boston, MA (United States),29 Nov - 3 Dec 1993; Other Information: PBD: Dec 1993
Country of Publication:
United States
Language:
English