Ecloud Build-Up Simulations for the FNAL MI for a Mixed Fill Pattern: Dependence on Peak SEY and Pulse Intensity During the Ramp
We present simulation results of the build-up of the electron-cloud density n{sub e} in three regions of the FNAL Main Injector (MI) for a beam fill pattern made up of 5 double booster batches followed by a 6th single batch. We vary the pulse intensity in the range N{sub t} = (2-5) x 10{sup 13}, and the beam kinetic energy in the range E{sub k} = 8-120 GeV. We assume a secondary electron emission model qualitatively corresponding to TiN, except that we let the peak value of the secondary electron yield (SEY) {delta}{sub max} vary as a free parameter in a fairly broad range. Our main conclusions are: (1) At fixed N{sub t} there is a clear threshold behavior of n{sub e} as a function of {delta}{sub max} in the range {approx} 1.1-1.3. (2) At fixed {delta}{sub max}, there is a threshold behavior of n{sub e} as a function of N{sub t} provided {delta}{sub max} is sufficiently high; the threshold value of N{sub t} is a function of the characteristics of the region being simulated. (3) The dependence on E{sub k} is weak except possibly at transition energy. Most of these results were informally presented to the relevant MI personnel in April 2010.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- Accelerator& Fusion Research Division
- DOE Contract Number:
- DE-AC02-05CH11231
- OSTI ID:
- 1004604
- Report Number(s):
- LBNL-4215E; TRN: US1101051
- Country of Publication:
- United States
- Language:
- English
Similar Records
Studies of E-Cloud Build up for the FNAL Main Injector and for theLHC
Electron-Cloud Build-up in the FNAL Main Injector